Analog/ Mixed Signal

Our Analog/ Mixed-Signal (AMS) services deliver seamless integration of high-performance analog and digital components in semiconductor designs. Our expertise spans DACs, ADCs, PLLs, power management solutions, and high-speed SerDes interfaces, ensuring optimal performance and power efficiency. We also specialize in IP porting across process nodes, enabling scalability and reuse. With advanced simulation, modeling, and verification methodologies, we help customers accelerate AMS innovation, while ensuring first-time-right silicon.

Design

Our expertise includes RTL design, ensuring optimal architecture and functionality, as well as foundation IP development for robust and reusable design blocks. We also specialize in custom standard cell development and characterization, optimizing designs for specific process nodes and performance requirements. With a focus on first-pass silicon success, we help customers accelerate product development while meeting stringent PPA goals.

Design Verification

We offer comprehensive IP and SoC-level verification services using C/C++ and SV-UVM methodologies. Our expertise spans CPU-based verification for Processors (ARM, RISC-V) and Interface Protocols (PCIe, USB, MIPI, DDR, HDMI, UFS, Ethernet, Bus). We emphasize robust planning to achieve functional and code coverage goals, along with power-aware verification and gate-level simulations. Our teams leverage formal verification, Portable Stimulus (PSS), and regression management tools to ensure high verification productivity and silicon success.

Physical Design

We deliver end-to-end physical design, executing multiple mixed-signal SoCs from spec to silicon in parallel. We specialize in complex IPs and subsystems across graphics, processors, PCIe Gen5, CXL 3.0, GDDR6, LPDDR4, and other domains. Our team achieves timing closure for high-frequency designs up to 3GHz on advanced nodes down to 3nm, with deep expertise in low-power specification development and implementation.

Design for Test

We offer complete Design for Test (DFT) services, including DFT architecture and scan methodology, RTL-level quality checks, scan insertion, ATPG pattern generation, and verification. We implement Memory BIST and Boundary Scan, conduct thorough fault coverage analysis, and provide debug and optimization. Our expertise extends to post-silicon debug support, ensuring high test coverage, silicon reliability, and faster time-to-market for complex SoCs.